E. A. Guevara-Cabezas, C. J. Rocha-Jácome, J. L. Tinajero-León, y M. A. Pacheco-Cunduri, «Reliability assessment in SiC and GaN power MOSFETs based emerging Wide Bandgap semiconductors technology from a systematic literature review», DC, vol. 8, n.º 1, pp. 1134–1153, feb. 2022.