GUEVARA-CABEZAS, E. A.; ROCHA-JÁCOME, C. J.; TINAJERO-LEÓN, J. L.; PACHECO-CUNDURI, M. A. Reliability assessment in SiC and GaN power MOSFETs based emerging Wide Bandgap semiconductors technology from a systematic literature review. Dominio de las Ciencias, [S. l.], v. 8, n. 1, p. 1134–1153, 2022. DOI: 10.23857/dc.v8i1.2627. Disponível em: https://dominiodelasciencias.com/ojs/index.php/es/article/view/2627. Acesso em: 2 may. 2024.