Guevara-Cabezas, E. A., Rocha-Jácome, C. J., Tinajero-León, J. L., & Pacheco-Cunduri, M. A. (2022). Reliability assessment in SiC and GaN power MOSFETs based emerging Wide Bandgap semiconductors technology from a systematic literature review. Dominio De Las Ciencias, 8(1), 1134–1153. https://doi.org/10.23857/dc.v8i1.2627